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Design optimization of pixel sensors using device simulations for the phase-II CMS tracker upgrade

机译:使用设备仿真对像素传感器进行设计优化,以进行II期CMS跟踪器升级

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摘要

In order to address the problems caused by the harsh radiation environment during the high luminosity phase of the LHC (HL-LHC), all silicon tracking detectors (pixels and strips) in the CMS experiment will undergo an upgrade. And so to develop radiation hard pixel sensors, simulations have been performed using the 2D TCAD device simulator, SILVACO, to obtain design parameters. The effect of various design parameters like pixel size, pixel depth, implant width, metal overhang, p-stop concentration, p-stop depth and bulk doping density on the leakage current and critical electric field are studied for both non-irradiated as well as irradiated pixel sensors. These 2D simulation results of planar pixels are useful for providing insight into the behaviour of non-irradiated and irradiated silicon pixel sensors and further work on 3D simulation is underway.
机译:为了解决LHC(HL-LHC)高发光度阶段中恶劣的辐射环境引起的问题,CMS实验中的所有硅跟踪检测器(像素和条带)都将进行升级。因此,为了开发辐射硬像素传感器,已经使用2D TCAD设备模拟器SILVACO进行了仿真,以获取设计参数。研究了各种设计参数的影响,如像素尺寸,像素深度,注入宽度,金属悬垂,p-stop浓度,p-stop深度和体掺杂密度对泄漏电流和临界电场的影响。辐照像素传感器。平面像素的这些2D模拟结果有助于深入了解未辐照和辐照的硅像素传感器的行为,并且正在进行3D模拟的进一步工作。

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